Bidimensional Empirical Mode Decomposition BEMD applied to speckle denoising for wavelet phase evaluation


K. Assid, V. Dembele, F. Alaoui, S. Houmairi, M. Sidki, A. Nassim*

Laboratoire IMC- OTIS : Optique &Traitement Image et Signal. Université Chouaib Doukkali -FSJ

B.P 20, El Jadida 24000 Morocco

* Corresponding author: E-mail:

Received: 04 May 2011; revised version accepted: 30 July 2011



     This paper presents an evaluation of the performance of the Bidimensional Empirical Mode Decomposition (BEMD) method when it is used to reduce speckle noise in Digital Speckle Pattern Interferometry (DSPI) fringes. The denoising approach was tested on real speckle correlation fringe pattern recorded from the thermomechanical study of the MOS power transistor. Applied to the wavelet phase evaluation, it provided a phase distribution with a good accuracy and avoiding the complex step of phase unwrapping.


Keywords: Bidimensional Empirical Mode Decomposition (BEMD); Digital Speckle Pattern Interferometry (DSPI); Residual Speckle denoising; Wavelet phase extraction.

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