Dielectric Study of

different Polycrystalline alumina (Al2O3)

B. Kchaou1*, A. Kallel1, Z. Fakhfakh1, D. Treheux2, D. Goeuriot3

1Laboratoire de Microscopie Electronique, Faculté des Sciences de Sfax, 3018 Sfax,Tunisie

2UMR5621 Ingénierie et de Fonctionnalisation des Surfaces, Ecole Centrale de Lyon, B.P.163, 69131 ECULLY, France

3Ecole Nationale Supérieure des Mines de Saint-Etienne,

Département Céramiques Spéciales, F42023 Saint-Etienne,France

* Corresponding author. E-mail : Zfakhfakh@yahoo.fr

Received : 21 November 2001; revised version accepted :13 February 2002

Abstract

Charge trapping / detrapping phenomena in ceramic (alumina) has been studied by the mirror method to carry out the role of grains boundaries on trapping and diffusion of charges.

First results showed clearly a good correlation between results of the mirror method [1, 2] and breakdown strength allowing us to understand the role of grain boundaries and additions on trapping and detrapping phenomenon. We use The mirror method performed inside of a SEMM.

Keywords : Dielectric; Ceramics; Breakdown; Trapping; Detrapping.

© 2015