Realization and first tests of an impedance measuring device in the [1mHz – 1MHz] FREQUENCy interval

M. Benhayoun1, A. Malaoui1,3, M. Ankrim1,

M. Y. EL Azhari2, A. Outzourhit2, E. L. Ameziane2, K. Quotb3

¹ Laboratoire d'Electronique et Instrumentations

²Laboratoire de Physique des Solides et des Couches Minces.

Département de Physique, Faculté des Sciences Semlalia Université Cadi Ayyad, B.P 2390 Marrakech, Maroc

³ Laboratoire de Physique des Interactions Ioniques & Moléculaires, Centre Saint Jérôme,

Université de Provence Aix Marseille, France

* Corresponding author. E-mail : mbenhayoun@ucam.ac.ma

Received : 08 November 2002; revised version accepted : 19 March 2003

Abstract

This work deals with the study, design and construction of an electrical impedance measuring apparatus in the [1mHz-1MHz] frequency range for solid material samples. The method used is based on measuring the complex electrical parameters applied to the studied samples. This equipment was used to characterize piezoelectric ceramics and semiconductor thin films.

Keywords : Impedance measurements; Electronic device; Resistor standard; Capacitor standard; Characterization, CdTe03 , Piezoelectric material; Thin films.

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