Efficient Analysis of Anisotropic Microstrip lines
with Substrates with Arbitrarily Varying Thickness
by the TLM Method
S. Ahyoud*, A. El Moussaoui, M. Essaaidi, M. Khalladi
Electronics & Microwaves Group,
Department of physics, Faculty of Sciences,Abdelmalek Essaadi University,
P. O. Box 2121,Tetuan 93000, Morocco
Phone: 212 061 72 59 92Fax: 212 039 99 45 00
* Corresponding author. E-mail :Sahyoud@hotmail.com
Received : 06 May 2002; revised version accepted : 25 October 2002
The symmetrical condensed node TLM method is used for the analysis of microstrip lines with anisotropic substrates of arbitrary varying thickness. The numerical results presented here permit to illustrate the effects of the individual tensor elements of the anisotropic substrate on the behavior of the resonant frequency. The validity of the obtained results is proved by comparisons with those obtained from the literature.
Keywords: Arbitrarily shaped substrate; TLM method; Resonant frequency.