Comparative study of secondary ion emission resulting from meV bombardment of cesium saltS

H. Allali1*, B. Nsouli2, A. Bakkali3, M. Aboulfatah1, M. Ahd4, A. Essaadani1, J. P. Thomas5

1Université Hassan 1er, Faculté des Sciences et Techniques, Département de Physique Appliquée,

Laboratoire d’Instrumentation et Analyse des Matériaux, B.P.577, 26000 Settat, Maroc

2Lebanese Atomic Energy Commission, CNRS, Beirut, Lebanon

3Université Hassan 1er. FST Settat, Département de Chimie Appliquée et Environnement, Maroc

4Université Ibn Tofaïl. Faculté des Sciences. Département de Physique, Kénitra, Maroc

5Université Claude Bernard Lyon I, Institut de Physique Nucléaire (BIAS). France

* Corresponding author. E-mail : h-allali@caramail.com
Received :15 February 2003; revised version accepted : 23 June 2004

Abstract

In this paper, we report on a comparative study of the secondary ion yields of five cesium salts (CsI, CsBr, CsCl, CsNO3 and Cs2SO4) under bombardment of Ar3+ ions at 9 MeV. Compared to the halides, the nitrate and the sulfate exhibit very high yields which can be attributed to the fragmentation of the NO3 and SO4 groups accompanied by the liberation of chemically active oxygen and oxygenated radicals. Furthermore, for negative secondary ion emission, quite different features are observed according to the nature of the salt investigated (halide or oxygenated).

Keywords : Cesium salts; HSF-SIMS; Secondary ion emission; Electronic sputtering.

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